專業Waveplates 廠商

From crystal growth, crystal orientation and cutting, to waveplate fabrication and coating, no other waveplate supplier has as much control over the fabrication stages as G&H.

Our waveplates been used in the cutting edge of research at Lawrence Livermore National Laboratory’s NIF project to the most demanding of production environments in semiconductor metrology equipment.

For all wavelength ranges, we orient, cut, and polish the optical crystals for waveplate production. Tight internal controls enable better retardation tolerances within and between production runs.

Polishing, coating, assembly, and metrology complete the manufacturing process.

Compound zero-order (also known as net-zero order) and achromatic waveplates are often optically contacted to reduce reflection losses at the surfaces. Air-spacing is recommended for high energy applications. Speciality waveplate designs such as off-axis or true-zero order waveplates are produced to custom specifications.

WAVEPLATES FROM THE UV TO THE NIR

From crystal orientation to assembled product, we produce cutting-edge waveplates for a varied range of applications and customers.

Crystal Quartz – standard material for UV-NIR waveplate applicationsLiNbO3 – infrequently used in 1.5 ?m applications and optical frequency shiftersMgF2 – typically used in combination with Crystal Quartz for achromatic waveplatesMica – for ophthalmology applicationsSapphire – for defense applications in extreme environmental conditionsYVO4 – waveplates for the 400 nm to 5 ?m ranges

WAVEPLATES FOR THE IR, HIGHER ENERGIES, OR LARGER FORMATS

As the world's only entirely vertically integrated CdS, CdSe, and KDP waveplate producer, we deliver accurate performance for demanding applications. Our control over crystal growth benefits customers who need larger sizes, high laser damage threshold performance, or more accurate retardation tolerances.

APPLICATIONS

Aerospace, astronomy, biomedical, laser power control and attenuation, military, optical isolation, polarimetry, remote sensing, semiconductor metrology, spectroscopy, surveillance.