Infrared Optics
Gooch & Housego
G&H deliver highly integrated, superior performing, infrared optical components leveraging our combination of technical skills, unique manufacturing competencies, and extensive metrology capabilities.
G&H brings together a set of capabilities which enables our customers to combine techniques, even on the same part. A unique, stand-out capability for G&H is our ability to manufacture complex shapes on lenses, such as step profiles or off-axis shapes.
We utilize several techniques either separately or in tandem to achieve superior product specifications, such as surface accuracies to better than 100 nm:
- High precision CNC processing
- Diamond turning
- Magnetorheological finishing (MRF®)
- Traditional polishing
Durable antireflection coatings from G&H are tailored to the application. Typical antireflection (AR) coatings include: Broadband, V-coat, and dual band. Broadband coatings perform well from 400-14000 nm wavelength ranges. Reflectivity as low as 0.25% for the 3-5 micron range is achievable.
Extensive metrology capabilities are critical to the abilities of G&H to meet and exceed difficult specifications.
- QED SSI stitching interferometry measures aspherics, full hemispheres, and OD up to 200 mm
- Taylor Hobson contact metrology tools measure surface roughness and surface accuracies up to 60 nm
- NewView™ 5000 white light interferometer is use for surface analysis and micro-roughness down to 2 Å RMS
- Computer generated holograms (CGH) can be utilized for volume production and high precision surface measurement.
Environmental testing of components and coatings is critical for assurance of performance in rugged conditions. Environmental testing capabilities include MIL-C-675C, MIL-C-48497A, MIL-E-12397, and MIL-M-13508C for endurance against abrasion, adhesion, humidity, temperature, and environmental conditions.
APPLICATIONS
Hyperspectral imaging, infrared microscopy, laser scanning microscopy, metrology, optical failure analysis for semiconductor processing, range finding, reconnaissance, surveillance, target identification, targeting and designating, thermal imaging.
| Substrate materials | ZnSe, ZnS, Ge, CaF2, MgF2, AMTIR, chalcogenides, silicon, sapphire |
| Sizes | 3to 250 mm |
| Surface roughness (Å, RMS) | 10 |
| Surfaceaccuracy | λ/20 |
| Scratch-dig | 10-5, material dependent |
| Optimized for |
Abrasive environments Transmission in high angles High long-termstability |
| Environmental testing | Humidity, sea salt spray, DIN, MIL |
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